X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)
Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic diffraction pattern results. This pattern is photographed with the digital X-ray sensor XRIS.
XR 4.0 X-ray LiF crystal, mounted
XR 4.0 X-ray Diaphragm tube d = 1 mm
XR 4.0 X-ray optical bench
XR 4.0 expert unit, X-ray unit, 35 kV
XR 4.0 X-ray Crystal holder for Laue-pattern
XRCT 4.0 X-ray Computed Tomography upgrade set
Vernier calliper stainless steel 0-160 mm, 1/20
XR 4.0 X-ray plug-in unit W tube
- The Laue diffraction of an LiF monocrystal is to be recorded with the aid of the digital X-ray sensor.
- The Miller indices of the corresponding crystal surfaces are to be assigned to the Laue reflections.
- Crystal lattices
- Crystal systems
- Crystal classes
- Bravais lattice
- Reciprocal lattice
- Miller indices
- Structure amplitude
- Atomic form factor
- The Bragg equation